Alfred Benninghoven,Richard J. Colton,David S. Simons,Helmut W. Werner: Secondary Ion Mass Spectrometry SIMS: V: Proceedings of the Fifth International Conference, Washington, DC, September 30 - October 4, 1985
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Author: Alfred Benninghoven,Richard J. Colton,David S. Simons,Helmut W. Werner
Number of Pages: 586 pages
Published Date: 11 Jan 2012
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Publication Country: Berlin, Germany
Language: English
ISBN: 9783642827266
Download Link: Click Here
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